Conferences

2024

1. Koteshwar, Anirudh, Deb, Deepjyoti, Hoque, Shanidul, Goswami, Rupam, "Analysis of Interface Trap Position Variation in Tunnel FETs", 2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON), Kolkata, India, 30 Nov. 2024 - 01 Dec. 2024, pp. 1-4. https://doi.org/10.1109/EDKCON62339.2024.10870770.

2. Deb, Deepjyoti, Nath, Saurav, Das, Prachuryya Subash, Baruah, Ratul Kr, Goswami, Rupam, "Lateral Straggle Based Interface Trap Sensitivity in npn SOI Double Gate TFETs", 2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON), Kolkata, India, 30 Nov. 2024 - 01 Dec. 2024, pp. 1-4. https://doi.org/10.1109/EDKCON62339.2024.10870613.

3. Choudhury, Hirakjyoti, Goswami, Rupam, Gautam, Raja Vipul, "Fabrication, Characterization and SPICE Calibration of Dropcasted Egg Albumin Memristors", 2024 IEEE International Conference of Electron Devices Society Kolkata Chapter (EDKCON), Kolkata, India, 30 Nov. 2024 - 01 Dec. 2024, pp. 1-4. https://doi.org/10.1109/EDKCON62339.2024.10870850.

2023

1. Nath, Dwipayan, Deb, Deepjyoti, Das, Prachuryya Subash, Choudhury, Hirakjyoti, Pathak, Priyam, Goswami, Rupam, "Impact of Doping and Temperature on Mobility in Single and Dual Core S/D GAA FinFETs", 2023 IEEE Devices for Integrated Circuit (DevIC), Kalyani, India, 2023, pp. 392-395. https://doi.org/10.1109/DevIC57758.2023.10134771.

2. Goswami, Rupam, Kumar, Vikas, Parida, Manoj Kumar, "Design and Development of a Charcoal-Based Sensor for Enhanced Soil Analysis in Precision Agriculture", International Conference on MAchine inTelligence for Research & Innovations, pp. 73-83, Springer Nature Singapore Singapore, 2023. https://doi.org/10.1007/978-981-99-8135-9_7

3. Choudhury, Hirakjyoti, Paul, Suvankar, Deb, Deepjyoti, Das, Prachuryya Subash, Goswami, Rupam, "A Single Memristor-based TTL NOT logic", Revista Tecnología En Marcha (Proceedings of IEEE Latin America Electron Device Conference, Puebla, Mexico, 03 - 05 July 2023), vol. 36, no. 6, pp. 88-94, June 2023. http://dx.doi.org/10.18845/tm.v36i6.6771.

4. Subash Das, Prachuryya, Deb, Deepjyoti, Goswami, Rupam, Sharma, Santanu, Saha, Rajesh, Choudhury, Hirakjyoti, "A dual-core source/drain GAA FinFET", Revista Tecnología En Marcha (Proceedings of IEEE Latin America Electron Device Conference, Puebla, Mexico, 03 - 05 July 2023), vol. 36, no. 6, pp. 5–11, June 2023. https://doi.org/10.18845/tm.v36i6.6748.

2022

1. Kumar, Pankaj, Koley, Kalyan, Goswami, Rupam, Maurya, Ashish, Kumar, Subindu, "Electrical Noise Behaviour of High-k Gate-All-Around MOSFET Based on Two-Port Device Network Analysis", 2022 14th International Conference on Information Technology and Electrical Engineering (ICITEE), Yogyakarta, Indonesia, 18-19 October 2022, pp. 68-72. https://doi.org/10.1109/ICITEE56407.2022.9954118.

2. Kumar, Pankaj, Koley, Kalyan, Goswami, Rupam, Maurya, Ashish, Kumar, Subindu, "Assessment of hot carrier stress induced threshold voltage shift in gate-all-around MOSFETs", 2022 IEEE 19th India Council International Conference (INDICON), Kochi, India, 24-26 Nov. 2022, pp. 1-4. https://doi.org/10.1109/INDICON56171.2022.10039693.

3. Saharia, Trinayan, Baruah, Ratul K, Goswami, Rupam, Sonowal, Durlav, "Validation and Implementation of a Smart Flood Surveillance System Based on Wireless Sensor Network", Micro and Nanoelectronics Devices, Circuits and Systems: Select Proceedings of MNDCS 2021, pp. 471-479, Springer Singapore, 2022. https://doi.org/10.1007/978-981-16-3767-4_46.

4. Routh, Sujay, Deb, Deepjyoti, Baruah, Ratul K, Goswami, Rupam, "Junctionless Tunnel FET for High-Temperature Applications from an Analog Design Perspective", 2022 IEEE International Conference on Nanoelectronics, Nanophotonics, Nanomaterials, Nanobioscience & Nanotechnology (5NANO), Kottayam, India, 28-29 Apr. 2022, pp. 1-4,. https://doi.org/10.1109/5NANO53044.2022.9828986.

2021

1. Deb, Deepjyoti, Goswami, Rupam, Baruah, Ratul Kr, Kandpal, Kavindra, Saha, Rajesh, "An SOI npn Double Gate TFET for Low Power Applications", 2021 Devices for Integrated Circuit (DevIC), Kalyani, India, 19-20 May 2021, pp. 621-623. https://doi.org/10.1109/DevIC50843.2021.9455827.

2020

1. Jakhar, Sahil, Singh Mandloi, Vishal, Goswami, Rupam, Kandpal, Kavindra, "A Low Power, High Speed 1.2 V Dynamic Comparator for Analog-to-Digital Converters", Procedia Computer Science (Proceedings of the Third International Conference on Computing and Network Communications (CoCoNet’19), 18-21 Dec. 2019, Trivandrum, India), vol. 171, 2020, pp. 1018-1026. https://doi.org/10.1016/j.procs.2020.04.109.

2019

1. Aggarwal, Anirudh, Goswami, Rupam, Kandpal, Kavindra, "Empirical Model of Surface Potential and Simulation Analyses for ZnO TFTs", 2019 IEEE Devices for Integrated Circuit (DevIC), Kalyani, India, 23-24 Mar. 2019, pp. 221-225. https://doi.org/10.1109/DEVIC.2019.8783775

2. Mishra, Satya Narayan, Jena, Kanjalochan, Goswami, Rupam, Agrawal, Anand, "Field-Plated AlInN/AlN/GaN MOSHEMT with Improved RF Power Performance", Advances in Signal Processing and Communication: Select Proceedings of International Conference on Signal Processing and Communication 2018, (21-23 Mar. 2018, Noida, India), pp. 611-617.

2018

1. Mishra, Subham, Verma, Sourabh, Prasad, Somendra, Bordoloi, Sushanta S., Goswami, Rupam, Jena, Kanjalochan, Jha, Vikas Kumar, Parvathi, K., "A Low Cost Charcoal Film Based Moisture Sensor: fabrication and computing", Soft Computing: Theories and Applications. Advances in Intelligent Systems and Computing, Select Proceedings of the Third International Conference on Soft Computing and Applications (SOCTA 2018), (21-23 Dec. 2018, Jalandhar, India), vol. 3, 2020. https://doi.org/10.1007/978-981-15-0751-9_1

2. Sahu, Sushree Anusmita, Mohapatra, SK, Goswami, Rupam, "Comparative Analysis of Double Gate TFET and Hetero Dielectric Double Gate TFET", 2018 International Conference on Applied Electromagnetics, Signal Processing and Communication (AESPC), Bhubaneswar, India, 22-24 October 2018, pp. 1-4. https://doi.org/10.1109/AESPC44649.2018.9033293.

2016

1. Goswami, Rupam, Bhowmick, Brinda, "Circular gate tunnel FET: Optimization and noise analysis", Procedia Computer Science (Proceedings of the 6th International Conference on Computing and Communication (ICACC 2016), 06-08 Sep. 2016, Cochin, India), vol. 93, pp. 125-131, Elsevier, 2016. https://doi.org/10.1016/j.procs.2016.07.191.

2015

1. Mitra, SK, Goswami, R, Bhowmick, B, "Optimization and scaling of an SOI TFET with back gate control", 2015 International Conference on Recent Developments in Control, Automation and Power Engineering (RDCAPE), 12-13 Mar. 2015, Noida, India, pp. 07-09. https://doi.org/10.1109/RDCAPE.2015.7281360.

2015

1. Goswami, Rupam, Bhowmick, Brinda, "Hetero-gate-dielectric gate-drain underlap nanoscale TFET with a deltap+ Si_1-x_Ge_x layer at source-channel tunnel junction", 2014 International Conference on Green Computing Communication and Electrical Engineering (ICGCCEE), 06-08 March 2014, Coimbatore, India, 2014, pp. 1-5. https://doi.org/10.1109/ICGCCEE.2014.6922302.

2. Bhowmick, B, Baishya, S, Goswami, R, Dasv, B, Joishy, C, "An optimized SOI g-TFET and its application in a half adder circuit", 2014 2nd International Conference on Devices, Circuits and Systems (ICDCS), 06-08 March 2014, Coimbatore, India, pp. 1-5. https://doi.org/10.1109/ICDCSyst.2014.6926156.